Conference
- R. Nebashi, N. Banno, M. Miyamura, X. Bai, K. Funahashi, K. Okamoto, N. Iguchi, H. Numata, T. Sugibayashi, T. Sakamoto, and M. Tada, “A 171k-LUT Nonvolatile FPGA using Cu Atom-Switch Technology in 28nm CMOS,” 2020 30th International Conference on Field-Programmable Logic and Applications (FPL), Gothenburg, Sweden, pp. 323-327 (2020).
- X. Bai, N. Banno, M. Miyamura, R. Nebashi, K. Okamoto, H. Numata, N. Iguchi, M. Hashimoto, T. Sugibayashi, T. Sakamoto and M. Tada, “1.5x Energy-efficient and 1.4x Operation-Speed Via-Switch FPGA with Rapid and Low-cost ASIC migration by Via-switch Copy”, Symposium on VLSI Technology (VLSI), (2020).
- K. Okamoto, R. Nebashi, N. Banno, X. Bai, H. Numata, N. Iguchi, M. Miyamura, H. Hada, K. Funahashi, Sugibayashi, T. Sakamoto, and M. Tada, “ON-state retention of Atom Switch eNVM for IoT/AI Inference Solution”, IEEE 2020 International Reliability Physics Symposium (IRPS), (2020).
- M. Hashimoto, X. Bai, N. Banno, M. Tada, T. Sakamoto, J. Yu, R. Doi, Y. Araki, H. Onodera, T. Imagawa, H. Ochi, K. Wakabayashi, Y. Mitsuyama, T. Sugibayashi, “Via-Switch FPGA: 65nm CMOS Implementation and Architecture Extension for AI Applications”, Technical Digest of International Solid-State Circuits Conference (ISSCC) (2020, San Francisco, USA), (2020).
- R. Nebashi, N. Banno, M. Miyamura, Y. Tsuji, A. Morioka, X. Bai, K. Okamoto, N. Iguchi, H. Hada, T. Sugibayashi, T. Sakamoto and M. Tada, “High-Density and Fault-Tolerant Cu Atom Switch Technology Toward 28nm-node Nonvolatile Programmable Logic”, Symposium on VLSI Technology (VLSI), (2018, Hawaii, USA), T12-2, (2018).
- T. Sakamoto, Y. Tsuji, X. Bai, M. Miyamura, A. Morioka, R. Nebashi, N. Banno, K. Okamoto, N. Iguchi H. Hada, T. Sugibayashi and M. Tada, “Atom Switch with Improved Cycle Endurance using Field Enhancement for Nonvolatile SoC”, IEEE International Memory Workshop, (2018, Kyoto, Japan), (2018) .
Journal
-
N. Banno, K. Okamoto, N. Iguchi, H. Ochi, H. Onodera, M. Hashimoto, T. Sugibayashi, T. Sakamoto and M. Tada, “Low-power Crossbar Switch with Two-Varistors Selected Complementary Atom Switch (2V-1CAS; Via-Switch) for Nonvolatile FPGA”, IEEE Transactions on Electron Devices, vol. 66, no. 8, pp.3331 – 3336 (2019).
-
K. Takeuchi , T. Sakamoto, M. Tada, A. Takeyama, T. Ohshima , S. Kuboyama , and H. Shindo, “Single-Event Effects Induced on Atom Switch-based Field-Programmable Gate Array”, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, Vol. 66, No. 7, pp.1355 – 1360 (2019).
- M. Tada and T. Sakamoto, “Set/Reset Switching Model of Cu Atom Switch based on electrolysis”, IEEE Transactions on Electron Devices, vol. 64, no. 4, pp.1812-1817 (2017).
- M. Miyamura, T. Sakamoto, X. Bai, Y. Tsuji, A. Morioka, R. Nebashi, M. Tada, N. Banno, K. Okamoto, N. Iguchi, H. Hada, T. Sugibayashi, Y. Nagamatsu, S. Ookubo, T. Shirai, F. Sugai and M. Inaba, “NanoBridge-based FPGA in High Temperature Environments”, IEEE Micro, Dep/Oct pp. 32-42 (2017).
解説記事 (Japanese)
- 阪本利司、宮村信、多田宗弘 「NanoBridge技術を用いた超低消費電力LSI」 電子情報通信学会誌 Vol.102 No.5 pp.408-412, 2019.
- 白旭、阪本利司、宮村信、多田宗弘 「微細CMOSと混載可能なCu原子スイッチ」 応用物理 第88巻 第2号 2019.